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Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94
Figure 1: (a) Picture of the resistance reference sample connected to the probe station. (b) Top view of the ...
Figure 2: Resistance map of the sample’s central zone (60 µm × 60 µm) imaged by C-AFM. Numbers refer to the i...
Figure 3: Relative deviations Δ = (Ri,AFM – Ri,cal)/Ri,cal in percent from imaging (full grey circles) and fr...